The interlayer transient describes the in-depth material profile of laterally averaged roughness.
It must be specified through one of
ba.ErfTransient()
ba.TanhTransient()
This defines the type of height distribution, while the root-meas-square value $\sigma$ is taken from interface autocorrelation model
ba.ErfTransient()
Corresponds to roughness with Gaussian height statistics.
The profile function:
$$ \dfrac{1}{2}\Big[1+erf\Big( \dfrac{x}{\sqrt{2}\sigma}\Big)\Big] $$
ba.TanhTransient()
Corresponds to roughness with non-Gaussian height statistics, with longer tails.
The profile function:
$$ \dfrac{1}{2}\Big[1+tanh\Big( \dfrac{\pi x}{2\sqrt{3}\sigma}\Big)\Big] $$
This example demonstrates how to apply different transients in a specular reflectivity calculation.
However, now the computation is performed twice with the standard $tanh$ interface profile and $erf$ (Névot-Croce) model that arises from a Gaussian distribution of the deviation from the mean-surface position.
In both cases, the root-mean-square deviation from the mean surface position is chosen to be $\sigma = 1$ nm.
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